Title: On the correlation between drain-gate breakdown voltage and hot-electron reliability in InP HEMT's
Authors: Menozzi, R ×
Borgarino, M
van der Zanden, Koen
Schreurs, Dominique #
Issue Date: Apr-1999
Publisher: Institute of Electrical and Electronics Engineers
Series Title: IEEE Electron Device Letters vol:20 issue:4 pages:152-154
ISSN: 0741-3106
Publication status: published
KU Leuven publication type: IT
Appears in Collections:ESAT- TELEMIC, Telecommunications and Microwaves
× corresponding author
# (joint) last author

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