Title: Low-frequency (1/f) noise behavior of locally stressed HfO2/TiN gate-stack pMOSFETs
Authors: Giusi, Gino ×
Simoen, Eddy
Eneman, Geert
Verheyen, Peter
Crupi, F
De Meyer, Christina
Claeys, Corneel
Ciofi, C #
Issue Date: 2006
Series Title: IEEE Electron Device Letters vol:27 issue:6 pages:508-610
ISSN: 0741-3106
Publication status: published
KU Leuven publication type: IT
Appears in Collections:Associated Section of ESAT - INSYS, Integrated Systems
× corresponding author
# (joint) last author

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