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Title: On the impact of TiN film thickness variations on the effective work
Authors: Singanamalla, Raghunath ×
Yu, HongYu
Pourtois, Geoffrey
Ferain, Isabelle
Kottantharayil, Anil
Kubicek, Stefan
Hoffmann, Thomas Y
Jurczak, Malgorzata
Biesemans, Serge
De Meyer, Christina #
Issue Date: May-2006
Series Title: IEEE Electron Device letters vol:27 issue:5 pages:332-334
ISSN: 0741-3106
Publication status: published
KU Leuven publication type: IT
Appears in Collections:Electrical Engineering - miscellaneous
× corresponding author
# (joint) last author

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