Title: Gate bias effect on the 60-MeV proton irradiation response of 65-nm CMOS nMOSFETs
Authors: Simoen, Eddy ×
David, Marie-Laure
Claeys, Corneel
Mohammadzadeh, Ali #
Issue Date: 2006
Series Title: IEEE Transactions on Electron Devices vol:53 issue:8 pages:1815-1820
ISSN: 0018-9383
Publication status: published
KU Leuven publication type: IT
Appears in Collections:Associated Section of ESAT - INSYS, Integrated Systems
× corresponding author
# (joint) last author

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