|ITEM METADATA RECORD
|Title: ||Gate bias effect on the 60-MeV proton irradiation response of 65-nm CMOS nMOSFETs|
|Authors: ||Simoen, Eddy ×|
Mohammadzadeh, Ali #
|Issue Date: ||2006 |
|Series Title: ||IEEE Transactions on Electron Devices vol:53 issue:8 pages:1815-1820|
|Publication status: ||published|
|KU Leuven publication type: ||IT|
|Appears in Collections:||Associated Section of ESAT - INSYS, Integrated Systems|
× corresponding author|
# (joint) last author|
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