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Title: Performance comparison of interconnect technology and architecture options for deep submicron technology nodes
Authors: Bamal, Mandeep ×
List, Scott
Stucchi, Michele
Verhulst, Anne
Van Hove, Marleen
Cartuyvels, Rudi
Beyer, Gerald
Maex, Karen #
Issue Date: Jun-2006
Publisher: IEEE
Conference: IEEE International Interconnect Technology Conference - IITC location:San Francisco, CA, USA date:05/06/06
Publication status: published
KU Leuven publication type: IC
Appears in Collections:Electrical Engineering - miscellaneous
Associated Section of ESAT - INSYS, Integrated Systems
ESAT - MICAS, Microelectronics and Sensors
× corresponding author
# (joint) last author

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