Title: Modeling electromigration-induced stress evolution and drift kinetics with a stress-dependent diffusivity
Authors: Chizhik, S. A ×
Matvienko, A. A
Sidelnikov, A. A
Proost, Joris #
Issue Date: 2000
Publisher: American Institute of Physics
Series Title: Journal of Applied Physics vol:88 issue:6 pages:3301-3309
ISSN: 0021-8979
Publication status: published
KU Leuven publication type: IT
Appears in Collections:Department of Materials Engineering - miscellaneous
× corresponding author
# (joint) last author

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