Title: Read stability and write-ability analysis of SRAM cells for nanometer technologies
Authors: Grossar, Evelyn ×
Stucchi, Michele
Maex, Karen
Dehaene, Wim #
Issue Date: Nov-2006
Publisher: Institute of Electrical and Electronics Engineers
Series Title: IEEE Journal of Solid-State Circuits vol:41 issue:11 pages:2577-2588
ISSN: 0018-9200
Publication status: published
KU Leuven publication type: IT
Appears in Collections:Associated Section of ESAT - INSYS, Integrated Systems
ESAT - MICAS, Microelectronics and Sensors
× corresponding author
# (joint) last author

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