Secondary Ion Mass Spectrometry - SIMS XII. Proceedings of the 12th International Conference; 5-10 Sept. 1999; Brussel, Belgium., Location: Leuven Belgium
Publication date:
2000-01-01
Pages:
631 -
634
Author:
Conard, Thierry
Kenens, Conny ; De Gendt, Stefan ; Claes, M ; Lagrange, Sébastien ; WorthA, W ; Vandervorst, Wilfried