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Title: Two-dimensional carrier profiling with Scanning Capacitance Microscopy, industry-ready innovative research
Authors: Duhayon, Natasja ×
Vandervorst, Wilfried
Hellemans, Louis #
Issue Date: 2003
Conference: 1st Flanders Engineering PhD Symposium location:Leuven Belgium date:11/12/03
Publication status: published
KU Leuven publication type: IC
Appears in Collections:Electrical Engineering - miscellaneous
× corresponding author
# (joint) last author

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