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Title: Temperature profile measurement and failure characterization of ESD protection devices using spectroscopic photon emission microscopy and Raman spectroscopy
Authors: Rasras, Mahmoud ×
De Wolf, Ingrid
Groeseneken, Guido
Chen, Jian
Bock, Karlheinz
Maes, Herman #
Issue Date: 1999
Host Document: pages:69-76
Conference: Conference Proceedings from the 25th International Symposium for Testing and Failure Analysis - ISTFA; 14-18 Nov. 1999; Santa Cl
Publication status: published
KU Leuven publication type: IC
Appears in Collections:Electrical Engineering - miscellaneous
Semiconductor Physics Section
Solid State Physics and Magnetism Section
Associated Section of ESAT - INSYS, Integrated Systems
ESAT - MICAS, Microelectronics and Sensors
× corresponding author
# (joint) last author

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