Title: Determining the limits of strain techniques in scaled CMOS devices
Authors: Snoeckx, Koen ×
Verheyen, Peter
Eneman, Geert #
Issue Date: Jul-2006
Series Title: Micro vol:24 issue:6 pages:37-42
Publication status: published
KU Leuven publication type: IT
Appears in Collections:Associated Section of ESAT - INSYS, Integrated Systems
× corresponding author
# (joint) last author

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