|ITEM METADATA RECORD
|Title: ||Determining the limits of strain techniques in scaled CMOS devices|
|Authors: ||Snoeckx, Koen ×|
Eneman, Geert #
|Issue Date: ||Jul-2006 |
|Series Title: ||Micro vol:24 issue:6 pages:37-42|
|Publication status: ||published|
|KU Leuven publication type: ||IT|
|Appears in Collections:||Associated Section of ESAT - INSYS, Integrated Systems|
× corresponding author|
# (joint) last author|
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