Title: Improvement of interfacial characteristics for Si-passivated Ge/HfO2 MOSFETs
Authors: Martens, Koen
Kaczer, Ben
Zimmerman, Paul
De Jaeger, Brice
Meuris, Marc
Groeseneken, Guido
Maes, Herman
Issue Date: 2006
Conference: Semiconductor Interface Specialists Conference location:Leuven Belgium date:13/12/06
Publication status: published
KU Leuven publication type: DI
Appears in Collections:Electrical Engineering - miscellaneous
Associated Section of ESAT - INSYS, Integrated Systems
ESAT - MICAS, Microelectronics and Sensors

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