Title: Gate oxide breakdown in FET devices and circuits: from nanoscale physics to system-level reliability
Authors: Kaczer, Ben ×
Degraeve, Robin
Roussel, Philippe
Groeseneken, Guido #
Issue Date: 2007
Series Title: Microelectronics Reliability vol:47 issue:4-5 pages:559-566
Conference: 14th Workshop of Dielectrics in Microelectronics - WoDiM location:Leuven Belgium date:26/06/06
ISSN: 0026-2714
Publication status: published
KU Leuven publication type: IT
Appears in Collections:Electrical Engineering - miscellaneous
ESAT - MICAS, Microelectronics and Sensors
× corresponding author
# (joint) last author

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