|ITEM METADATA RECORD
|Title: ||Influence of gate oxide reliability on FinFET characteristics|
|Authors: ||Fernandez, Raul ×|
Aymerich, X #
|Issue Date: ||2006 |
|Conference: ||2nd Workshop of the Thematic Network on Silicon on Insulator Technology, Devices and Circuits - EUROSOI location:Barcelona Spain date:08/03/06|
|Publication status: ||published|
|KU Leuven publication type: ||IC|
|Appears in Collections:||Electrical Engineering - miscellaneous|
ESAT - MICAS, Microelectronics and Sensors
× corresponding author|
# (joint) last author|
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