ITEM METADATA RECORD
Title: Influence of gate oxide reliability on FinFET characteristics
Authors: Fernandez, Raul ×
Kaczer, Ben
Rodriguez, Rosana
Nafria, Montserat
Groeseneken, Guido
Aymerich, X #
Issue Date: 2006
Conference: 2nd Workshop of the Thematic Network on Silicon on Insulator Technology, Devices and Circuits - EUROSOI location:Barcelona Spain date:08/03/06
Publication status: published
KU Leuven publication type: IC
Appears in Collections:Electrical Engineering - miscellaneous
ESAT - MICAS, Microelectronics and Sensors
× corresponding author
# (joint) last author

Files in This Item:

There are no files associated with this item.

Request a copy

 




All items in Lirias are protected by copyright, with all rights reserved.