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Title: CV characterization of Ge/HfO2 MOSFETs passivated with a thin epitaxial Si layer
Authors: De Jaeger, Brice
Kaczer, Ben
Pourghaderi, Mohammad Ali
Houssa, Michel
Meuris, Marc
Heyns, Marc
Issue Date: 2006
Conference: Semiconductor Interface Specialists Conference - SISC location:Leuven Belgium date:07/12/06
Publication status: published
KU Leuven publication type: DI
Appears in Collections:Electrical Engineering - miscellaneous
Department of Materials Engineering - miscellaneous

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