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Title: A systematic study of trade-offs in engineering a locally strained pMOSFET
Authors: Nouri, Faran ×
Verheyen, Peter
Washington, Lori
Moroz, Victor
De Wolf, Ingrid
Kawaguchi, S
Biesemans, Serge
Schreutelkamp, Rob
Kim, Y
Shen, M
Xu, X
Rooyackers, Rita
Jurczak, Malgorzata
Eneman, Geert
De Meyer, Christina
Smith, L
Pramanik, D
Forstner, H
Thirupapuliyur, S
Higashi, G #
Issue Date: 2004
Publisher: IEEE
Host Document: pages:1055-1058
Conference: Technical Digest International Electron Devices Meeting - IEDM location:Sunnyvale, CA US date:13/12/04
Publication status: published
KU Leuven publication type: IC
Appears in Collections:Electrical Engineering - miscellaneous
Associated Section of ESAT - INSYS, Integrated Systems
× corresponding author
# (joint) last author

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