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Title: On the impact of the capture rates on the generation/recombination lifetime ratio of a single deep level
Authors: Simoen, Eddy ×
Claeys, Cor #
Issue Date: 1999
Series Title: IEEE Transactions on Electron Devices vol:46 issue:7 pages:1487-1488
ISSN: 0018-9383
Publication status: published
KU Leuven publication type: IT
Appears in Collections:Electrical Engineering - miscellaneous
Associated Section of ESAT - INSYS, Integrated Systems
× corresponding author
# (joint) last author

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