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Title: Reliability aspects of the low-frequency noise behaviour of submicron CMOS technologies
Authors: Simoen, Eddy ×
Claeys, Cor #
Issue Date: 1999
Series Title: Semiconductor Science and Technology vol:14 pages:R61-R71
ISSN: 0268-1242
Publication status: published
KU Leuven publication type: IT
Appears in Collections:Electrical Engineering - miscellaneous
Associated Section of ESAT - INSYS, Integrated Systems
× corresponding author
# (joint) last author

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