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Title: Diode analysis of silicon substrate quality
Authors: Simoen, Eddy ×
Poyai, Amporn
Claeys, Cor
Czerwinski, A #
Issue Date: 1999
Host Document: pages:248-258
Conference: Analytical and Diagnostic Techniques for Semiconductor Materials, Devices and Processes. Joint Proceedings of the the Symposia location:Leuven Belgium
Publication status: published
KU Leuven publication type: IC
Appears in Collections:Electrical Engineering - miscellaneous
Associated Section of ESAT - INSYS, Integrated Systems
× corresponding author
# (joint) last author

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