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Title: In-situ SEM observation of electromigration in thin metal films at accelerated stress conditions
Authors: D'Haen, Jan ×
Van Olmen, Jan
Beelen, Z
Manca, Jean
Martens, T
De Ceuninck, Ward
D'olieslaeger, Marc
Schepper, L
Cannaerts, Maarten
Maex, Karen #
Issue Date: 2000
Series Title: Microelectronics Reliability vol:40 issue:08/10/07 pages:1407-1412
ISSN: 0026-2714
Publication status: published
KU Leuven publication type: IT
Appears in Collections:Solid State Physics and Magnetism Section
Associated Section of ESAT - INSYS, Integrated Systems
× corresponding author
# (joint) last author

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