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|ITEM METADATA RECORD
|Title: ||In-situ SEM observation of electromigration in thin metal films at accelerated stress conditions|
|Authors: ||D'Haen, Jan ×|
Van Olmen, Jan
De Ceuninck, Ward
Maex, Karen #
|Issue Date: ||2000 |
|Series Title: ||Microelectronics Reliability vol:40 issue:08/10/07 pages:1407-1412|
|Publication status: ||published|
|KU Leuven publication type: ||IT|
|Appears in Collections:||Solid State Physics and Magnetism Section|
Associated Section of ESAT - INSYS, Integrated Systems
× corresponding author|
# (joint) last author|
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