|ITEM METADATA RECORD
|Title: ||Limitations of Minority Carrier Lifetime as a Parameter for Evaluating Iron Contamination in Silicon|
|Authors: ||Rotondaro, Antonio|
|Issue Date: ||1994 |
|Conference: ||186th Electrochemical Society Fall Meeting: Symposium on High Purity Silicon III; October 9-14, 1994; Miami, Florida, USA. location:Leuven Belgium|
|Publication status: ||published|
|KU Leuven publication type: ||DI|
|Appears in Collections:||Clinical Residents Medicine|
Electrical Engineering - miscellaneous
Associated Section of ESAT - INSYS, Integrated Systems
|Files in This Item:
There are no files associated with this item.
Request a copy
All items in Lirias are protected by copyright, with all rights reserved.