Title: Limitations of Minority Carrier Lifetime as a Parameter for Evaluating Iron Contamination in Silicon
Authors: Rotondaro, Antonio
Hurd, Trace
Mertens, Paul
Schmidt, Harald
Heyns, Marc
Simoen, Eddy
Vanhellemont, Jan
Vegh, Gerzson
Claeys, Cor
Gräf, D
Issue Date: 1994
Conference: 186th Electrochemical Society Fall Meeting: Symposium on High Purity Silicon III; October 9-14, 1994; Miami, Florida, USA. location:Leuven Belgium
Publication status: published
KU Leuven publication type: DI
Appears in Collections:Clinical Residents Medicine
Electrical Engineering - miscellaneous
Associated Section of ESAT - INSYS, Integrated Systems

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