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Title: Impact of the Substrate Quality on the Low Frequency Noise of Silicon Diodes
Authors: Simoen, Eddy
Bosman, Gijs
Vanhellemont, Jan
Claeys, Cor
Issue Date: 1994
Conference: 6th Van der Ziel Symposium on Quantum 1/f Noise and Other Low Frequency Fluctuations in Electronic Devices; May 27-28, 1994; St. location:Leuven Belgium
Publication status: published
KU Leuven publication type: DI
Appears in Collections:Electrical Engineering - miscellaneous
Associated Section of ESAT - INSYS, Integrated Systems

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