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Title: Empirical Relationship Between the Low-Frequency Noise Spectral Density and the Transconductance of Silicon-on-Insulator n-Channel Metal-Oxide-Semiconductor Transistors
Authors: Simoen, Eddy ×
Claeys, Cor #
Issue Date: 1994
Series Title: Applied Physics Letters vol:65 pages:1946-1948
ISSN: 0003-6951
Publication status: published
KU Leuven publication type: IT
Appears in Collections:Electrical Engineering - miscellaneous
Associated Section of ESAT - INSYS, Integrated Systems
× corresponding author
# (joint) last author

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