|ITEM METADATA RECORD
|Title: ||Analytical characterization of new high k dielectric stacks|
|Authors: ||De Witte, Hilde|
|Issue Date: ||2000 |
|Conference: ||Quantitative Surface Analysis-11; 3-7 July 2000; Surrey, UK.|
|Publication status: ||published|
|KU Leuven publication type: ||DI|
|Appears in Collections:||Electrical Engineering - miscellaneous|
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