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Title: Reliability issues in deep deep sub-micron technologies: time-dependent variability and its impact on embedded system design
Authors: Papanikolaou, Antonis ×
Miranda Corbalan, Miguel
Wang, Hua
Catthoor, Francky
Satyakiran, Munaga
Marchal, Pol
Kaczer, Ben
Bruynseraede, Christophe
Tokei, Zsolt #
Issue Date: Oct-2006
Host Document: pages:342-347
Conference: IFIP International Conference on Very Large Scale Integration - VLSI-SoC location:Leuven Belgium date:16/10/06
Publication status: published
KU Leuven publication type: IC
Appears in Collections:Electrical Engineering - miscellaneous
× corresponding author
# (joint) last author

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