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|ITEM METADATA RECORD
|Title: ||Reliability issues in deep deep sub-micron technologies: time-dependent variability and its impact on embedded system design|
|Authors: ||Papanikolaou, Antonis ×|
Miranda Corbalan, Miguel
Tokei, Zsolt #
|Issue Date: ||Oct-2006 |
|Host Document: ||pages:342-347|
|Conference: ||IFIP International Conference on Very Large Scale Integration - VLSI-SoC location:Leuven Belgium date:16/10/06|
|Publication status: ||published|
|KU Leuven publication type: ||IC|
|Appears in Collections:||Electrical Engineering - miscellaneous|
× corresponding author|
# (joint) last author|
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