Title: Advanced modeling and parameter extraction of the MOSFET ESD breakdown triggering in the 90nm CMOS node technologies
Authors: Vassilev, Vesselin
Lorenzini, Martino
Jansen, Philippe
Groeseneken, Guido
Thijs, Steven
Mahadeva Iyer, Natarajan
Steyaert, Michel
Maes, Herman #
Issue Date: 2004
Publisher: IEEE
Host Document: Electrical Overstress / Electrostatic Discharge Symposium Proceedings pages:2.B.1
Conference: Electrical Overstress / Electrostatic Discharge Symposium location:Leuven Belgium date:19/09/04
Publication status: published
KU Leuven publication type: IC
Appears in Collections:Electrical Engineering - miscellaneous
ESAT - MICAS, Microelectronics and Sensors
Associated Section of ESAT - INSYS, Integrated Systems
# (joint) last author

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