Title: Model for the radiation degradation of polycrystalline silicon films
Authors: Nakabayashi, M ×
Ohyama, H
Takakura, K
Simoen, Eddy
Claeys, Corneel #
Issue Date: 2003
Series Title: IEEE Transactions on Nuclear Science vol:50 issue:6 pages:2481-2485
ISSN: 0018-9499
Publication status: published
KU Leuven publication type: IT
Appears in Collections:Associated Section of ESAT - INSYS, Integrated Systems
× corresponding author
# (joint) last author

Files in This Item:

There are no files associated with this item.

Request a copy


All items in Lirias are protected by copyright, with all rights reserved.

© Web of science