Proceedings of the 13th International Conference on Electron Microscopy (ICEM); July 17-22, 1994; Paris, France., Date: 1994/07/17 - 1994/07/22, Location: FRANCE, PARIS
Publication date:
1994-01-01
Pages:
639 -
640
ISSN:
2-86883-226-1
Publisher:
EDITIONS PHYSIQUE
ELECTRON MICROSCOPY 1994, VOLS 2A AND 2B
Author:
Tavares, J
Bender, Hugo ; Larsen, Kim Kyllesbech ; Lauwers, A ; Maex, Karen ; Van Rossum, Marc ; Jouffrey, B ; Colliex, C
Keywords:
Science & Technology, Technology, Materials Science, Multidisciplinary, Microscopy, Materials Science