Title: On the Hot-Carrier-Induced Post-Stress Interface Trap Generation in n-Channel MOS Transistors
Authors: Bellens, Rudi ×
De Schrijver, Erik
Van den bosch, G
Groeseneken, Guido
Heremans, Paul
Maes, Herman #
Issue Date: 1994
Series Title: IEEE Transactions on Electron Devices vol:41 pages:413-419
ISSN: 0018-9383
Publication status: published
KU Leuven publication type: IT
Appears in Collections:ESAT - MICAS, Microelectronics and Sensors
Associated Section of ESAT - INSYS, Integrated Systems
× corresponding author
# (joint) last author

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