Title: Pinhole density measurements of barriers deposited on low-k films
Authors: Shamiryan, Denis ×
Abell, Thomas
Le, Quoc Toan
Maex, Karen #
Issue Date: Nov-2003
Series Title: Microelectronic Engineering vol:70 issue:02/04/07 pages:341-345
ISSN: 0167-9317
Publication status: published
KU Leuven publication type: IT
Appears in Collections:Associated Section of ESAT - INSYS, Integrated Systems
× corresponding author
# (joint) last author

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