Title: Oxide and Interface Degradation Resulting from Substrate Hot-Hole Injection at 295K and 77K
Authors: Van den bosch, G ×
Groeseneken, Guido
Maes, Herman
Klein, R
Saks, N. S #
Issue Date: 1994
Series Title: J. Appl. Phys. vol:75 pages:2073-2080
Publication status: published
KU Leuven publication type: IT
Appears in Collections:ESAT - MICAS, Microelectronics and Sensors
Associated Section of ESAT - INSYS, Integrated Systems
× corresponding author
# (joint) last author

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