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Title: A study of the As-processed and generated leakage paths in Al203-based dielectric stacks for nonvolatile memory applications
Authors: Ruiz Aguado, Daniel ×
Govoreanu, Bogdan
Degraeve, Robin
Van Houdt, Jan
De Meyer, Christina #
Issue Date: Sep-2006
Host Document: pages:407-410
Conference: ESSDERC. Proceedings of the 36th European Solid-State Device Research Conference location:Leuven Belgium date:18/09/06
Publication status: published
KU Leuven publication type: IC
Appears in Collections:Electrical Engineering - miscellaneous
× corresponding author
# (joint) last author

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