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Title: Interface Trap Related Generation-Recombination Noise in Submicron Buried-Channel SOI pMOSFETs
Authors: Claeys, Cor
Simoen, Eddy
Lukyanchikova, N
Petrichuk, M
Garbar, N
Issue Date: 1994
Conference: 1st ELEN Workshop on Noise in Electronic Systems; October 18-20, 1994; Montpellier, France.
Publication status: published
KU Leuven publication type: DI
Appears in Collections:Electrical Engineering - miscellaneous
Associated Section of ESAT - INSYS, Integrated Systems

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