|ITEM METADATA RECORD
|Title: ||Resonant laser-induced post-ionisation SIMS for application to semiconductor problems|
|Authors: ||De Bisschop, Peter ×|
Vandervorst, Wilfried #
|Issue Date: ||1994 |
|Host Document: ||pages:335-338|
|Conference: ||SIMS IX. Proceedings of the 9th International Conference on Secondary Ion Mass Spectrometry; 7-12 November 1993; Yokohama, Japan location:Leuven Belgium|
|Publication status: ||published|
|KU Leuven publication type: ||IC|
|Appears in Collections:||Nuclear and Radiation Physics Section|
× corresponding author|
# (joint) last author|
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