Title: MOSFET ESD breakdown modeling and parameter extraction in advanced CMOS technologies
Authors: Vassilev, Vesselin ×
Lorenzini, Martino
Groeseneken, Guido #
Issue Date: 2006
Series Title: IEEE Transactions on Electron Devices vol:53 issue:9 pages:2108-2117
ISSN: 0018-9383
Publication status: published
KU Leuven publication type: IT
Appears in Collections:Electrical Engineering - miscellaneous
ESAT - MICAS, Microelectronics and Sensors
× corresponding author
# (joint) last author

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