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Title: Impact of biasing scheme and environment conditions on the lifetime of RF-MEMS
Authors: Czarnecki, Piotr
Rottenberg, Xavier
Puers, Robert
De Wolf, Ingrid
Issue Date: 2006
Publisher: Ed. Academiei Romane
Host Document: pages:157-162
Publication status: published
KU Leuven publication type: IHb
Appears in Collections:Electrical Engineering - miscellaneous
ESAT - MICAS, Microelectronics and Sensors

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