Title: Technology-aware ESD-reliable RF CMOS circuit design
Authors: Linten, Dimitri
Thijs, Steven
Scholz, Mirko
Tremouilles, David
Mahadeva Iyer, Natarajan
Groeseneken, Guido
Issue Date: 2006
Conference: IEEE Custom Integrated Circuits Conference - CICC location:Leuven Belgium date:10/09/06
Publication status: published
KU Leuven publication type: DI
Appears in Collections:Electrical Engineering - miscellaneous
ESAT - MICAS, Microelectronics and Sensors

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