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|ITEM METADATA RECORD
|Title: ||Achievements and challenges for the electrical performance of MOSFETs with high-k gate dielectrics|
|Authors: ||Groeseneken, Guido ×|
De Gendt, Stefan
Heyns, Marc #
|Issue Date: ||2004 |
|Host Document: ||pages:147-155|
|Conference: ||Proceedings of the IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits location:Leuven Belgium date:05/07/04|
|Publication status: ||published|
|KU Leuven publication type: ||IC|
|Appears in Collections:||Electrical Engineering - miscellaneous|
Associated Section of ESAT - INSYS, Integrated Systems
Molecular Design and Synthesis
ESAT - MICAS, Microelectronics and Sensors
× corresponding author|
# (joint) last author|
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