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Title: Achievements and challenges for the electrical performance of MOSFETs with high-k gate dielectrics
Authors: Groeseneken, Guido ×
Pantisano, Luigi
Ragnarsson, Lars-Ake
Degraeve, Robin
Houssa, Michel
Kauerauf, Thomas
Roussel, Philippe
De Gendt, Stefan
Heyns, Marc #
Issue Date: 2004
Publisher: IEEE
Host Document: pages:147-155
Conference: Proceedings of the IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits location:Leuven Belgium date:05/07/04
Publication status: published
KU Leuven publication type: IC
Appears in Collections:Electrical Engineering - miscellaneous
Associated Section of ESAT - INSYS, Integrated Systems
Molecular Design and Synthesis
ESAT - MICAS, Microelectronics and Sensors
× corresponding author
# (joint) last author

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