Title: Hole traps in silicon dioxides - Part I: Properties
Authors: Zhang, J.F ×
Zhao, C.Z
Chen, A.H
Groeseneken, Guido
Degraeve, Robin #
Issue Date: Aug-2004
Series Title: IEEE Transactions on Electron Devices vol:51 issue:8 pages:1267-1273
ISSN: 0018-9383
Publication status: published
KU Leuven publication type: IT
Appears in Collections:Electrical Engineering - miscellaneous
ESAT - MICAS, Microelectronics and Sensors
× corresponding author
# (joint) last author

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