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Title: New aspects of nanopotentiometry for MOSFET transistors
Authors: Trenkler, Thomas ×
Stephenson, Robert
Jansen, Philippe
Vandervorst, Wilfried
Hellemans, Louis #
Issue Date: 1999
Host Document: pages:188-198
Conference: Proceedings 5th International Workshop on the Measurement, Characterization, and Modeling of Ultra-Shallow Doping Profiles in Se
Publication status: published
KU Leuven publication type: IC
Appears in Collections:Electrical Engineering - miscellaneous
× corresponding author
# (joint) last author

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