Title: Characterization and modeling of transient device behavior under CMD ESD stress
Authors: Willemen, J ×
Andreini, A
De Heyn, Vincent
Esmark, K
Etherton, M
Gieser, H
Groeseneken, Guido
Mettler, S
Morena, E
Qu, N
Soppa, W
Stadler, W
Stella, R
Wilkening, W
Wolf, H
Zullino, L #
Issue Date: 2004
Series Title: Journal of Electrostatics vol:62 issue:02/03/07 pages:133-153
Publication status: published
KU Leuven publication type: IT
Appears in Collections:Electrical Engineering - miscellaneous
ESAT - MICAS, Microelectronics and Sensors
× corresponding author
# (joint) last author

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