Title: Modeling pFET currents after soft breakdown at different gate locations
Authors: Kaczer, Ben ×
De Keersgieter, An
Degraeve, Robin
Crupi, Felice
Groeseneken, Guido #
Issue Date: Apr-2004
Series Title: Microelectronic Engineering vol:72 issue:01/04/07 pages:125-129
ISSN: 0167-9317
Publication status: published
KU Leuven publication type: IT
Appears in Collections:Electrical Engineering - miscellaneous
ESAT - MICAS, Microelectronics and Sensors
× corresponding author
# (joint) last author

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