Title: Experimental analysis of a Ge-HfO2-TaN gate stack with a large amount of interface states
Authors: Croon, Jeroen
Kaczer, Ben
Lujan, Guilherme
Kubicek, Stefan
Groeseneken, Guido
Meuris, Marc
Issue Date: 2004
Conference: Semiconductor Interface Specialists Conference - SISC location:Leuven Belgium date:09/12/04
Publication status: published
KU Leuven publication type: DI
Appears in Collections:Electrical Engineering - miscellaneous
ESAT - MICAS, Microelectronics and Sensors

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