Title: The influence of recovery and temperature on the NBTI power-law exponent
Authors: Kaczer, Ben
Degraeve, Robin
Arkhipov, Vladimir
Collaert, Nadine
Groeseneken, Guido
Goodwin, Michael
Issue Date: 2004
Conference: Semiconductor Interface Specialists Conference - SISC location:Leuven Belgium date:09/12/04
Publication status: published
KU Leuven publication type: DI
Appears in Collections:Electrical Engineering - miscellaneous
ESAT - MICAS, Microelectronics and Sensors

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