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Title: Scaling CMOS: finding the optimal gate dielectric
Authors: Kauerauf, Thomas ×
Govoreanu, Bogdan
Degraeve, Robin
Groeseneken, Guido #
Issue Date: Mar-2004
Host Document: pages:35-38
Conference: ULIS - 5th European Workshop on ULtimate Integration of Silicon location:Leuven Belgium date:11/03/04
Publication status: published
KU Leuven publication type: IC
Appears in Collections:Associated Section of ESAT - INSYS, Integrated Systems
Electrical Engineering - miscellaneous
ESAT - MICAS, Microelectronics and Sensors
× corresponding author
# (joint) last author

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