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Title: Low Frequency Noise as a Diagnostic Tool for Quality Assessment for MOSFETs
Authors: Vandamme, Ewout
Claeys, Cor
Vandamme, L
Issue Date: 1994
Conference: 1st ELEN Workshop on Noise in Electronic Systems; October 18-20, 1994; Montpellier, France.
Publication status: published
KU Leuven publication type: DI
Appears in Collections:Electrical Engineering - miscellaneous
Associated Section of ESAT - INSYS, Integrated Systems

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