|ITEM METADATA RECORD
|Title: ||Radiation-induced defects in SiC-MESFETs after 2-MeV electron irradiation|
|Authors: ||Ohyama, H ×|
Claeys, Corneel #
|Issue Date: ||2006 |
|Series Title: ||Physica B vol:376-377 pages:382-384|
|Publication status: ||published|
|KU Leuven publication type: ||IT|
|Appears in Collections:||Associated Section of ESAT - INSYS, Integrated Systems|
× corresponding author|
# (joint) last author|
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