Title: Radiation-induced defects in SiC-MESFETs after 2-MeV electron irradiation
Authors: Ohyama, H ×
Takakura, K
Uemura, K
Shigaki, K
Kudou, T
Arai, M
Kuboyama, S
Matsuda, S
Kamezawa, C
Simoen, Eddy
Claeys, Corneel #
Issue Date: 2006
Series Title: Physica B vol:376-377 pages:382-384
Publication status: published
KU Leuven publication type: IT
Appears in Collections:Associated Section of ESAT - INSYS, Integrated Systems
× corresponding author
# (joint) last author

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