This item still needs to be validated !
|ITEM METADATA RECORD
|Title: ||On the Electrical Activity of Oxygen-Related Extended Defects in Silicon|
|Authors: ||Vanhellemont, Jan ×|
Clauws, P #
|Issue Date: ||1994 |
|Host Document: ||pages:670-683|
|Conference: ||Silicon Materials Science and Technology. (Semiconductor Silicon/1994); May 22-27, 1994; San Francisco, CA, USA. location:Leuven Belgium|
|Publication status: ||published|
|KU Leuven publication type: ||IC|
|Appears in Collections:||Electrical Engineering - miscellaneous|
Associated Section of ESAT - INSYS, Integrated Systems
× corresponding author|
# (joint) last author|
|Files in This Item:
There are no files associated with this item.
Request a copy
All items in Lirias are protected by copyright, with all rights reserved.