Title: Analysis of HBM ESD Testers and Specifications Using a Fourth Order Lumped Element Model
Authors: Verhaege, K ×
Roussel, Philippe
Groeseneken, Guido
Maes, Herman
Gieser, H
Russ, Christian
Egger, P
Guggenmos, X
Kuper, F. G #
Issue Date: 1994
Series Title: Quality and Reliability Engineering International vol:10 pages:325-334
Publication status: published
KU Leuven publication type: IT
Appears in Collections:Associated Section of ESAT - INSYS, Integrated Systems
ESAT - MICAS, Microelectronics and Sensors
× corresponding author
# (joint) last author

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