Title: Write/Erase Degradation and Disturb Effects in Source-Side Injection Flash EEPROM Devices
Authors: Wellekens, Dirk ×
Van Houdt, Jan
Faraone, Lorenzo
Groeseneken, Guido
Maes, Herman #
Issue Date: 1994
Host Document: pages:147-153
Conference: Proceedings of the 5th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis (ESREF); October 4-7, location:Leuven Belgium
Publication status: published
KU Leuven publication type: IC
Appears in Collections:ESAT - MICAS, Microelectronics and Sensors
Associated Section of ESAT - INSYS, Integrated Systems
× corresponding author
# (joint) last author

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